DocumentCode :
2848233
Title :
Analysis of the Statistical Properties of the SINR in the IEEE 802.16 OFDMA Network
Author :
Moiseev, S.N. ; Filin, S.A. ; Kondakov, M.S. ; Garmonov, A.V. ; Do Hyon Yim ; Jaeho Lee
Author_Institution :
JSC Kodofon, Voronezh, Russia. smoiseev@kodofon.vrn.ru
Volume :
12
fYear :
2006
fDate :
38869
Firstpage :
5595
Lastpage :
5599
Abstract :
In the IEEE 802.16 network the SINR per subcarrier, the average SINR, and the SINR RMS are stochastic processes. In this paper, we analyze the statistical properties of these stochastic processes using system level simulation. We present the probability density functions for the SINR per subcarrier and the average SINR stochastic processes expressed in both logarithmic and linear scales. We also present the probability density function for the SINR RMS stochastic process, expressed in the logarithmic scale. The results, obtained in this paper, allow using the statistical approach while developing the adaptive transmission algorithms for the IEEE 802.16 network.
Keywords :
Analytical models; Error probability; Interference; Laser sintering; OFDM; Probability density function; Root mean square; Signal to noise ratio; Stochastic processes; System performance; IEEE 802.16; OFDMA; SINR; probability density function;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Communications, 2006. ICC '06. IEEE International Conference on
Conference_Location :
Istanbul
ISSN :
8164-9547
Print_ISBN :
1-4244-0355-3
Electronic_ISBN :
8164-9547
Type :
conf
DOI :
10.1109/ICC.2006.255553
Filename :
4024953
Link To Document :
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