DocumentCode
2848324
Title
On-Chip Transmission Line Modeling and Applications to Millimeter-Wave Circuit Design in 0.13um CMOS Technology
Author
Ko, Chun-Lin ; Kuo, Chien-Nan ; Juang, Ying-Zong
Author_Institution
Nat. Chiao Tung Univ., Hsinchu
fYear
2007
fDate
25-27 April 2007
Firstpage
1
Lastpage
4
Abstract
This paper presents the on-chip transmission line modeling and applications to circuit design at millimeter-wave (ram-wave) frequencies. The microstrip model of circuit simulators benefits in fast calculations of the characteristics of microstrip lines. As the structure of on-chip microstrip differs from the modeled structure, two key parameters of the microstrip model need to be modified for the different electromagnetic (EM) behavior according to the measured microstrip line. With proper parameters, the traditional transmission line model is able to accurately predict the real characteristic of on-chip microstrip lines without time-consuming EM simulation. A mm-wave microstrip line filter and a single-stage cascode low noise amplifier (LNA) are fabricated to verify the model. All passive components for input/output matching networks and bias networks are on-chip. The LNA takes the supply voltage and dc current of 1.4 V and 10 mA, respectively. A gain of 3.8 dB and an input/output return loss of 8.5/7.0 dB are measured at 60.3 GHz. The simulation results in both circuits are in good agreement with measured data.
Keywords
CMOS integrated circuits; MIMIC; low noise amplifiers; microstrip filters; CMOS technology; bias network; cascode low noise amplifier; circuit simulator; current 10 mA; frequency 60.3 GHz; gain 3.8 dB; input/output matching network; microstrip model; millimeter-wave circuit design; millimeter-wave frequency; mm-wave microstrip line filter; on-chip microstrip line; on-chip transmission line modeling; voltage 1.4 V; CMOS technology; Circuit simulation; Circuit synthesis; Distributed parameter circuits; Electromagnetic modeling; Microstrip; Millimeter wave circuits; Millimeter wave measurements; Predictive models; Semiconductor device modeling; CMOS; bandpass filter; low noise amplifier; millimeter wave frequency; transmission line;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design, Automation and Test, 2007. VLSI-DAT 2007. International Symposium on
Conference_Location
Hsinchu
Print_ISBN
1-4244-0583-1
Electronic_ISBN
1-4244-0583-1
Type
conf
DOI
10.1109/VDAT.2007.373243
Filename
4239435
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