• DocumentCode
    2848372
  • Title

    Investigation of the small pixel effect in CdZnTe detectors

  • Author

    Wilson, Matthew D. ; Seller, Paul ; Veale, Matthew C. ; Sellin, Paul J.

  • Author_Institution
    Rutherford Appleton Lab., Didcot
  • Volume
    2
  • fYear
    2007
  • fDate
    Oct. 26 2007-Nov. 3 2007
  • Firstpage
    1255
  • Lastpage
    1259
  • Abstract
    The signal shapes produced by alpha and X-ray radiation in 2 mm thick CdZnTe detectors have been measured. The signals produced in a single large pad detector and a 300 mum pixilated detector have been compared. The influence of the small pixel effect and it´s variation with detector bias is visible. Synopsys Sentaurus TCAD is used to simulate the charge carrier motion in the detectors and is compared against the measured signals. A description of how the simulations will aid detector design with optimal pixel size, inter-pixel spacing and bias voltage is included.
  • Keywords
    X-ray detection; gamma-ray detection; high energy physics instrumentation computing; nuclear electronics; semiconductor counters; technology CAD (electronics); CdZnTe detectors; Synopsys Sentaurus TCAD; X-ray radiation; alpha radiation; bias voltage; charge carrier motion; optimal pixel size; signal shapes; size 2 mm; small pixel effect; Charge carriers; Charge measurement; Current measurement; Motion detection; Radiation detectors; Shape measurement; Signal detection; Thickness measurement; X-ray detection; X-ray detectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2007. NSS '07. IEEE
  • Conference_Location
    Honolulu, HI
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-0922-8
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2007.4437231
  • Filename
    4437231