Title :
Automation of Synchronous Bias Transmission Line Pulsing System
Author :
Chang, Bor-Wei ; Hsu, Hsin-Chyh ; Ker, Ming-Dou
Author_Institution :
Ind. Technol. Res. Inst., Hsinchu
Abstract :
Synchronous bias transmission line pulsing (SB-TLP) system is able to provide a synchronous bias voltage to transmission line pulse. It´s a more useful test bench to evaluate actual circuit characteristics of electrostatic discharge (ESD) protection design with gate-driven mechanism than traditional Transmission Line Pulsing (TLP) system. It´s important to set up an automatic SB-TLP system and be able to immediately analyze measured data which is more convenient to engineers. All of the instruments are controlled by a software written in LabVIEW environment to create a smart and friendly test workbench.
Keywords :
CMOS integrated circuits; electrostatic discharge; integrated circuit reliability; integrated circuit testing; transmission lines; virtual instrumentation; automatic SB-TLP; electrostatic discharge protection design; synchronous bias transmission line pulsing system; synchronous bias voltage; Automation; Circuit testing; Data analysis; Distributed parameter circuits; Electrostatic discharge; Electrostatic measurements; Protection; System testing; Transmission lines; Voltage;
Conference_Titel :
VLSI Design, Automation and Test, 2007. VLSI-DAT 2007. International Symposium on
Conference_Location :
Hsinchu
Print_ISBN :
1-4244-0583-1
Electronic_ISBN :
1-4244-0583-1
DOI :
10.1109/VDAT.2007.373254
