DocumentCode
2848479
Title
Solder Joint Reliability of Sn-Ag-Cu BGA and Sn-Pb Solder Paste
Author
Sun, Fujiang
Author_Institution
Huawei Technol. Co. Ltd., Shenzhen
fYear
2005
fDate
2-2 Sept. 2005
Firstpage
1
Lastpage
6
Abstract
In the transition to lead-free, components suppliers need carry the product of lead-free and lead components. This could cause the extensive logistic problems in manufacturing. Therefore, it is necessary to study the solder joint character of Sn-Ag-Cu BGA and Sn-Pb solder paste. In this study, the results of solder joint shape and reliability evaluations of PBGA (plastic ball grid array) lead-free package assembled to PCBs (printed circuit boards) with eutectic Sn-Pb solder paste was presented. The lead-free package was assembled under various reflow profiles and PCB surface finish. The peak temperature of reflow soldering of 210, 225 and 235 degC with the soak profile was used. The PCB surface finish included HASL (hot air soldering level) and ENIG (electro-less Ni/immersion Au). The different types of solder joints, both as-reflowed and after reliability test were examined using optical microscope, transmission X-Ray. The reliability test of TTC (thermal torsion cycling) and ATC (accelerated thermal cycling) was used. Detailed failure analysis is also presented
Keywords
ball grid arrays; copper alloys; failure analysis; lead alloys; life testing; optical microscopes; printed circuits; reflow soldering; silver alloys; solders; tin alloys; 210 C; 225 C; 235 C; ENIG; PBGA; SnAgCu; SnPb; accelerated thermal cycling; failure analysis; hot air soldering level; lead-free package; optical microscope; plastic ball grid array; printed circuit boards; reflow profiles; reflow soldering; reliability test; solder joint reliability; solder paste; surface finish; thermal torsion cycling; transmission X-ray; Assembly; Environmentally friendly manufacturing techniques; Lead; Logistics; Optical microscopy; Packaging; Shape; Soldering; Surface finishing; Testing; BGA; Lead-free; Sn-Ag-Cu; Sn-Pb; Solder joints reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology, 2005 6th International Conference on
Conference_Location
Shenzhen
Print_ISBN
0-7803-9449-6
Type
conf
DOI
10.1109/ICEPT.2005.1564608
Filename
1564608
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