Title :
Nanoscale silicon ion-sensitive field-effect transistors for pH sensor and biosensor applications
Author :
Jeong-Soo Lee ; Sungho Kim ; Kihyun Kim ; Taiuk Rim ; Yoon-Ha Jeong ; Meyyappan, M.
Abstract :
Increased demand for point-of-care diagnostics has provided a strong motivation for the development of lab-on-a chip systems. The most important part to develop the system is to realize sensing components with high sensitivity, high reliability, low power consumption, low noise and small size in a cost- effective way. The Si-nanowire (Si-NW) ion-sensitive field effect transistor (ISFET) has been considered as one of the most promising devices because of the well-established fabrication techniques taking advantage of the low-cost wafer-scale top down methods [1-2]. In this work, the Si-NW ISFETs with embedded Ag/AgCI electrode have been demonstrated. The DC characteristics and the pH response of the Si-NW ISFET were measured and analysed. In addition, the low-frequency noise measurement was performed in order to investigate noise characteristics of the Si-NW ISFETs.
Keywords :
biosensors; chemical sensors; elemental semiconductors; embedded systems; ion sensitive field effect transistors; lab-on-a-chip; low-power electronics; nanoelectronics; nanowires; noise measurement; pH measurement; silicon; silver compounds; Ag-AgCl; DC characteristics; Si; Si-NW ISFET; Si-nanowire ion-sensitive field effect transistor; biosensor application; embedded electrode; fabrication techniques; lab-on-a chip systems; low noise; low power consumption; low-cost wafer-scale top down methods; low-frequency noise measurement; nanoscale silicon ion-sensitive field-effect transistors; noise characteristics; pH response; pH sensor application; point-of-care diagnostics; sensing components; Electrodes; Logic gates; Noise; Optical buffering; Semiconductor device measurement; Sensitivity; Silicon;
Conference_Titel :
Electron Devices and Solid-State Circuits (EDSSC), 2011 International Conference of
Conference_Location :
Tianjin
Print_ISBN :
978-1-4577-1998-1
Electronic_ISBN :
Pending
DOI :
10.1109/EDSSC.2011.6117562