• DocumentCode
    2848672
  • Title

    [Front cover]

  • fYear
    2007
  • fDate
    23-25 April 2007
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    The following topics are dealt with: VLSI technology; VLSI manufacture; three-dimensional integrated circuits; non-volatile memory; semiconductor productivity; BlueGene supercomputer; cell broadband engine; silicon photonics; flash memory; metal gate/high-k stack; reliability; characterization; non-planar CMOS; process/BEOL; and simulation/modeling of advanced devices.
  • Keywords
    CMOS integrated circuits; VLSI; flash memories; integrated circuit reliability; integrated circuit technology; integrated circuit yield; integrated optics; parallel machines; semiconductor device manufacture; BlueGene supercomputer; VLSI manufacture; VLSI technology; advanced devices; cell broadband engine; flash memories; metal gate/high-k stack; nonplanar CMOS; nonvolatile memories; process/BEOL; reliability; semiconductor productivity; silicon photonics; three-dimensional integrated circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, Systems and Applications, 2007. VLSI-TSA 2007. International Symposium on
  • Conference_Location
    Hsinchu
  • ISSN
    1524-766X
  • Print_ISBN
    1-4244-0584-X
  • Type

    conf

  • DOI
    10.1109/VTSA.2007.378891
  • Filename
    4239459