DocumentCode
2848716
Title
The impact of technology on radiation-hardened integrated circuits
Author
Spratt, J. ; Schnable, G. ; Standeven, J.
Author_Institution
Philco-Ford Corp., Blue Bell, Pa., USA
Volume
XII
fYear
1969
fDate
19-21 Feb. 1969
Firstpage
156
Lastpage
157
Abstract
The physics, process technology, and circuit design of radiation-hardened ICs will be discussed. Appropriate circuit design, plus optimum processing techniques (dielectric isolation, small geometry, controlled assembly methods, etc.) will be shown to improve low-power integrated circuits to the point where they no longer limit most systems exposed to nuclear weapons.
Keywords
Design engineering; Electronic circuits; Integrated circuit technology; Ionization; Neutrons; Nuclear weapons; Photoconductivity; Silicon; Space technology; Transient analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference. Digest of Technical Papers. 1969 IEEE Internationa
Conference_Location
Philadelphia, PA, USA
Type
conf
DOI
10.1109/ISSCC.1969.1154772
Filename
1154772
Link To Document