• DocumentCode
    2848716
  • Title

    The impact of technology on radiation-hardened integrated circuits

  • Author

    Spratt, J. ; Schnable, G. ; Standeven, J.

  • Author_Institution
    Philco-Ford Corp., Blue Bell, Pa., USA
  • Volume
    XII
  • fYear
    1969
  • fDate
    19-21 Feb. 1969
  • Firstpage
    156
  • Lastpage
    157
  • Abstract
    The physics, process technology, and circuit design of radiation-hardened ICs will be discussed. Appropriate circuit design, plus optimum processing techniques (dielectric isolation, small geometry, controlled assembly methods, etc.) will be shown to improve low-power integrated circuits to the point where they no longer limit most systems exposed to nuclear weapons.
  • Keywords
    Design engineering; Electronic circuits; Integrated circuit technology; Ionization; Neutrons; Nuclear weapons; Photoconductivity; Silicon; Space technology; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1969 IEEE Internationa
  • Conference_Location
    Philadelphia, PA, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1969.1154772
  • Filename
    1154772