Title :
2-D system identification from bispectrum samples
Author :
Salvia, A. David ; Valenzuela, Hector M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Pennsylvania State Univ., University Park, PA, USA
Abstract :
The problem of modeling 2-D system transfer functions given only bispectrum samples of the noisy output is considered. This identification procedure is a three-step process. First, the output bispectrum samples are calculated along a 2-D slice in the 4-D bispectrum frequency region. Next, these samples are used to obtain a rational model of the bispectrum slice via a 2-D divided difference approach. Finally, two methods for finding the underlying system transfer function parameters from this rational model are developed. This system identification procedure is general in that it does not impose causality, recursibility, or minimum phase restrictions on the system to be identified
Keywords :
parameter estimation; signal processing; spectral analysis; statistical analysis; transfer functions; 2-D divided difference approach; 2-D system transfer functions; 4-D bispectrum frequency region; bispectrum samples; bispectrum slice; higher order statistics; noisy output; rational model; signal processing; system identification; Additive noise; Fourier transforms; Frequency conversion; Frequency domain analysis; Gaussian noise; Multidimensional signal processing; Multidimensional systems; Rail to rail outputs; System identification; Transfer functions;
Conference_Titel :
Acoustics, Speech, and Signal Processing, 1992. ICASSP-92., 1992 IEEE International Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-0532-9
DOI :
10.1109/ICASSP.1992.226232