DocumentCode
2848784
Title
A Factory Health Monitor: System identification, process monitoring, and control
Author
Schroeder, K. ; Moyne, J. ; Tilbury, D.M.
Author_Institution
Dept. of Mech. Eng., Michigan Univ., Ann Arbor, MI
fYear
2008
fDate
23-26 Aug. 2008
Firstpage
16
Lastpage
22
Abstract
An important quality of manufacturing process implementation is ensuring that all controllers operate exactly as they are intended when applied to a system. Unfortunately, because the many subsystems in a factory are often developed independently, this is not always the case and logical errors and incorrect software-hardware interactions can exist and develop which can cause non-optimal or incorrect operation and lower plant efficiency. The factory health monitor (FHM) is a factory floor information analysis system that was created to improve industrial processes by reducing the time required to identify errors in operation. This research associated with FHM development addresses the issues and implementation of a non-intrusive monitoring scheme, a method of system identification appropriate to a manufacturing process, and suggests methods and future research in error avoidance. The system identification method is described in detail with a focus on the communication of relevant information to the operator and system. The FHM was applied to test setups and an industrial testbed, where accurate system models were created. The benefits of using the FHM are illustrated through the identification and avoidance of a particular hardware based error present in the industrial testbed.
Keywords
information systems; manufacturing processes; process control; process monitoring; quality control; factory floor information analysis system; factory health monitoring; industrial process; manufacturing process quality; nonintrusive monitoring scheme; process monitoring; system identification; Automation; Bridges; Conferences; USA Councils;
fLanguage
English
Publisher
ieee
Conference_Titel
Automation Science and Engineering, 2008. CASE 2008. IEEE International Conference on
Conference_Location
Arlington, VA
Print_ISBN
978-1-4244-2022-3
Type
conf
DOI
10.1109/COASE.2008.4626536
Filename
4626536
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