DocumentCode :
2848890
Title :
Analysis and architecture design of block matching in BM3D image denoising
Author :
Chen, Hongming ; Liu, Wenjiang ; Liu, Taizhi ; Cheng, Yuhua
Author_Institution :
Shanghai Res. Inst. of Microelectron. (SHRIME), Peking Univ., Shanghai, China
fYear :
2011
fDate :
17-18 Nov. 2011
Firstpage :
1
Lastpage :
2
Abstract :
In this paper, a low-cost VLSI implementation for Block Matching (BM) in BM3D image denoising with novel architectures of the slip window and SSD tree are presented. The experimental results show that the proposed technique preserves the BM3D denoising performance and obtains excellent performances in terms of less logic gate count and better visual quality. The design requires only low computational complexity and less SRAM for slip window. Its hardware cost is quite low, about 350k gates. Synthesis results show that the proposed design at a throughput about 177MB/s by using UMC 0.18um technology.
Keywords :
SRAM chips; VLSI; computational complexity; image denoising; image matching; logic design; logic gates; BM3D image denoising; SRAM; SSD tree; UMC; architecture design; block matching; computational complexity; hardware cost; image matching; logic gate count; low cost VLSI implementation; slip window; visual quality; Correlation; Image denoising; Noise reduction; Pipelines; Random access memory; Three dimensional displays; Throughput; BM3D; Image denoising; SSD tree; pipeline stage; slip window;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices and Solid-State Circuits (EDSSC), 2011 International Conference of
Conference_Location :
Tianjin
ISSN :
Pending
Print_ISBN :
978-1-4577-1998-1
Electronic_ISBN :
Pending
Type :
conf
DOI :
10.1109/EDSSC.2011.6117574
Filename :
6117574
Link To Document :
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