Title :
Semiconductor spectrum analyzer for monochromatic radiation
Author :
Kornilovich, A.A. ; Uvarov, E.I. ; Vdovin, A.V. ; Skok, E.M.
Author_Institution :
Novosibirsk State Tech. Univ., Russia
Abstract :
The paper presents a semiconductor spectrum analyzer (SCSA) operating on the principle of nonlinear spin resonance excited in n-InSb due to stimulated combinational light scattering with signal amplification
Keywords :
III-V semiconductors; indium compounds; infrared spectroscopy; microwave-optical double resonance; spectral analysers; stimulated Raman scattering; 4.8 to 6.2 mum; IR spectroscopy; InSb; monochromatic radiation; n-InSb; nonlinear spin resonance; signal amplification; spectrum analyzer; stimulated combinational light scattering; Free electron lasers; Frequency; Laser tuning; Magnetic field measurement; Magnetic resonance; Nonlinear optics; Optical scattering; Pump lasers; Resonance light scattering; Testing;
Conference_Titel :
Electronic Instrument Engineering Proceedings, 1998. APEIE-98. Volume 1. 4th International Conference on Actual Problems of
Conference_Location :
Novosibirsk
Print_ISBN :
0-7803-4938-5
DOI :
10.1109/APEIE.1998.768897
