• DocumentCode
    284901
  • Title

    A subspace fitting approach to super resolution multi-line fitting and straight edge detection

  • Author

    Aghajan, Hamid K. ; Kailath, Thomas

  • Author_Institution
    Inf. Syst. Lab., Stanford Univ., CA, USA
  • Volume
    3
  • fYear
    1992
  • fDate
    23-26 Mar 1992
  • Firstpage
    121
  • Abstract
    A new fundamental signal processing method is developed for solving the problem of fitting multiple lines in a two-dimensional image. The proposed technique formulates the multiline fitting problem in a special parameter estimation framework such that a signal structure similar to the sensor array processing signal representation is obtained. Then, recently developed algorithms in that formalism (e.g., the ESPRIT technique) are exploited to produce superresolution estimates in this framework. The signal representation used in this formulation can be generalized in a fashion to handle both problems of line fitting (in which a set of binary-valued discrete pixels is given) and of straight edge detection (in which one starts with a gray-scale image). The proposed method possesses extensive computational speed superiority over previous single- and multiple-line fitting algorithms such as the Hough transform method. Details of the new formulation are explained, and several experimental results are presented
  • Keywords
    curve fitting; edge detection; ESPRIT; algorithms; binary-valued discrete pixels; computational speed; gray-scale image; sensor array processing signal representation; signal processing; signal structure; straight edge detection; subspace fitting; superresolution estimates; superresolution multiline fitting; two-dimensional image; Array signal processing; Fitting; Image edge detection; Parameter estimation; Pixel; Sensor arrays; Signal processing; Signal processing algorithms; Signal representations; Signal resolution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Acoustics, Speech, and Signal Processing, 1992. ICASSP-92., 1992 IEEE International Conference on
  • Conference_Location
    San Francisco, CA
  • ISSN
    1520-6149
  • Print_ISBN
    0-7803-0532-9
  • Type

    conf

  • DOI
    10.1109/ICASSP.1992.226261
  • Filename
    226261