Controller design for a closed-loop scanning tunneling microscope

Author

Ahmad, Irfan ; Voda, Alina ; Besançon, Gildas

Author_Institution

Dept. of Control Syst., ENSIEG-INPG, Grenoble

fYear

2008

fDate

23-26 Aug. 2008

Firstpage

971

Lastpage

976

Abstract

This paper focuses on controller design for a closed-loop scanning tunneling microscope to deal with fast variations in sample surface. A linear approximation approach is used to deal with non-linearities. The desired performances are then achieved by a controller design based on pole placement with sensitivity function shaping using second order digital notch filters. The corresponding simulation results show better performances than those obtained with PID control techniques.

Keywords

closed loop systems; control nonlinearities; control system synthesis; digital filters; notch filters; physical instrumentation control; pole assignment; scanning tunnelling microscopy; sensitivity analysis; PID control; closed-loop scanning tunneling microscope; control nonlinearity; controller design; linear approximation approach; robust pole placement; second order digital notch filter; sensitivity function shaping method; Automatic control; Control systems; Feedback control; Microscopy; Open loop systems; Shape control; State feedback; Three-term control; Tunneling; Voltage control; Controller design; Linear approximation; Scanning tunneling microscope; Sensitivity function shaping; Simulation;

fLanguage

English

Publisher

ieee

Conference_Titel

Automation Science and Engineering, 2008. CASE 2008. IEEE International Conference on

Conference_Location

Arlington, VA

Print_ISBN

978-1-4244-2022-3

Electronic_ISBN

978-1-4244-2023-0

Type

conf

DOI

10.1109/COASE.2008.4626558

Filename

4626558