Title :
Process capability sensitivity analysis for design evaluation of multi station assembly systems
Author :
Huang, Wenzhen ; Kong, Zhenyu
Author_Institution :
Dept. of Mech. Eng., Massachusetts Univ., Dartmouth, MA
Abstract :
Yield, i.e. the conformity of quality characteristics, is defined as an evaluation index to represent the process capability of multistation manufacturing systems (MMS). A model based method is developed for the yield sensitivity analysis. The sensitivity indicates the impact of design parameters, such as design nominal, tolerances, and specifications, to the quality conformity of a process. Three algorithms for the sensitivity analysis are developed. A floor pan assembly case study is presented for validation.
Keywords :
assembling; design engineering; manufacturing systems; quality management; sensitivity analysis; design evaluation; evaluation index; floor plan assembly; multistation assembly systems; multistation manufacturing systems; process capability; quality characteristics; quality conformity; sensitivity analysis; Assembly systems; Bridges; Cause effect analysis; Design automation; Design engineering; Manufacturing automation; Process design; Sensitivity analysis; System performance; Uncertainty;
Conference_Titel :
Automation Science and Engineering, 2008. CASE 2008. IEEE International Conference on
Conference_Location :
Arlington, VA
Print_ISBN :
978-1-4244-2022-3
Electronic_ISBN :
978-1-4244-2023-0
DOI :
10.1109/COASE.2008.4626559
