مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

2849140

Title :

Reliability

Volume :

XIII

fYear :

1970

fDate :

18-20 Feb. 1970

Firstpage :

Lastpage :

Abstract :

Lists the sessions held at the conference proceedings.

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Solid-State Circuits Conference. Digest of Technical Papers. 1970 IEEE International

Conference_Location :

Philadelphia, PA, USA

Type :

conf

DOI :

10.1109/ISSCC.1970.1154799

Filename :

1154799

Link To Document :