The influence of the inductance on the voltage-current characteristic and on low frequency performance of DC SQUIDs

Author

Greenberg, Ya.S.

Author_Institution

Novosibirsk State Tech. Univ., Russia

fYear

1998

fDate

1998

Firstpage

87

Lastpage

92

Abstract

The paper is devoted to the detailed study of the way by which the inductance of the two junction interferometer (DC SQUID) influences its voltage current characteristic and the low frequency current noise. A rigorous mathematical procedure for the calculation of the averaged voltage across the symmetrical DC SQUID is developed for the nonzero values of the interferometer loop inductance L. The L-dependent part of the voltage noise which comes from the low frequency fluctuations of the junctions´ critical current is also found. The obtained results can be used for the correct evaluation of the important SQUID characteristics and for the development of the effective techniques for the electronic cancellation of the low frequency fluctuations in practical devices

Keywords

1/f noise; SQUIDs; critical currents; current fluctuations; inductance; superconducting device noise; DC SQUIDs; averaged voltage; critical current; electronic cancellation; inductance influence; low frequency current noise; low frequency fluctuations; low frequency performance; symmetrical SQUID; two junction interferometer; voltage-current characteristic; Critical current; Equations; Fluctuations; Frequency; Inductance; Low-frequency noise; Noise cancellation; SQUIDs; Superconducting device noise; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronic Instrument Engineering Proceedings, 1998. APEIE-98. Volume 1. 4th International Conference on Actual Problems of

Conference_Location

Novosibirsk

Print_ISBN

0-7803-4938-5

Type

conf

DOI

10.1109/APEIE.1998.768918

Filename

768918