• DocumentCode
    284929
  • Title

    Variational pattern analysis using Gabor wavelets

  • Author

    Bovik, Alan C.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
  • Volume
    4
  • fYear
    1992
  • fDate
    23-26 Mar 1992
  • Firstpage
    669
  • Abstract
    Measuring local frequencies is an effective approach to analyzing globally nonstationary, yet locally coherent images. The local frequencies may be manifested as, e.g., flowlike, granular, or oriented patterns. It is necessary to make spectral measurements accurate in both frequency and space, conflicting requirements constrained by a generalized uncertainty relationship. Such spectral measurements can be obtained from multiple wavelet-like channel filters that yield a locus of possible frequency solutions. Thus locus of solutions is maximally localized in both space/frequency if the channel filters are Gabor wavelets. A solution is obtained by imposing stabilizing terms developing naturally from assumptions on the signal. The frequency measurement problem is cast as a regularized extremum problem, leading to an iterative constraint propagation algorithm. As a to an iterative constraint propagation algorithm. As a byproduct local image contrast measurement is also obtained
  • Keywords
    filtering and prediction theory; image processing; wavelet transforms; Gabor wavelets; flowlike pattern; frequency measurement problem; frequency solutions; granular pattern; image processing; iterative constraint propagation algorithm; local frequencies; local image contrast measurement; locus of solutions; multiple wavelet-like channel filters; oriented patterns; spectral measurements; stabilizing terms; variational pattern analysis; Band pass filters; Equations; Frequency measurement; Frequency response; Gabor filters; Laboratories; Machine vision; Pattern analysis; Virtual reality; Wavelet analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Acoustics, Speech, and Signal Processing, 1992. ICASSP-92., 1992 IEEE International Conference on
  • Conference_Location
    San Francisco, CA
  • ISSN
    1520-6149
  • Print_ISBN
    0-7803-0532-9
  • Type

    conf

  • DOI
    10.1109/ICASSP.1992.226309
  • Filename
    226309