DocumentCode :
2849298
Title :
Transport measurements on AlSb/InAs nanostructures
Author :
Kruppa, W. ; Boos, J.B. ; Magno, R. ; Park, D. ; Bennett, B.R. ; Bass, R. ; Keye, D.
Author_Institution :
Naval Res. Lab., Washington, DC, USA
fYear :
1998
fDate :
11-15 May 1998
Firstpage :
777
Lastpage :
780
Abstract :
The fabrication and characterization of AlSb/InAs nanostructures are reported. Both basic split-gate and split-gate-based quantum dot structures were examined. Considerable structure in the cryogenic conductance characteristics, including 2e2/h staircases and periodic oscillations suggestive of Coulomb blockade, were found. Conductance staircase effects were observed in the basic split-gate structure above 25 K and to about 10 mV of drain bias at 4.2 K. Single-electron tunneling phenomena, probably due to fluctuation potentials, were observed in the dot structure at 4.2 K
Keywords :
Coulomb blockade; III-V semiconductors; aluminium compounds; indium compounds; nanostructured materials; semiconductor quantum dots; tunnelling; 2e2/h staircases; 4.2 K; AlSb-InAs; AlSb/InAs nanostructures; Coulomb blockade; basic split-gate structure; characterization; conductance staircase effects; cryogenic conductance characteristics; drain bias; fabrication; fluctuation potentials; periodic oscillations; single-electron tunneling phenomena; split-gate-based quantum dot structure; transport measurements; Conducting materials; Electrons; Etching; Fabrication; Gallium arsenide; Nanostructures; Quantization; Quantum dots; Split gate flash memory cells; Tunneling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide and Related Materials, 1998 International Conference on
Conference_Location :
Tsukuba
ISSN :
1092-8669
Print_ISBN :
0-7803-4220-8
Type :
conf
DOI :
10.1109/ICIPRM.1998.712778
Filename :
712778
Link To Document :
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