Title :
Nano-scale leakage characterizations of the γ-APTES/ silica nanoparticles bionanocomposite
Author :
Hsu, Po-Yen ; Lin, Jing-Jenn ; Jhuang, Jheng-Jia ; Wu, You-Lin
Author_Institution :
Dept. of Electr. Eng., Nat. Chi Nan Univ., Nantou, Taiwan
Abstract :
This work proposes the nano-scale leakage characterizations for post-UV irradiated membrane of a polydimethylsiloxane (PDMS)-treated hydrophobic fumed silica nanoparticles (NPs) and 3-aminopropyltriethoxysilane mixture (γ-APTES+NPs+UV) by conductive atomic-force-microscopy (C-AFM). We found the leakage characterizations of the γ-APTES+NPs+UV are similar to those of dielectric material. Our results show that prolonged UV illumination (120s) and 100:1 γ-APTES/silica NPs mixing ratio result in the lowest leakage current and highest breakdown voltage.
Keywords :
atomic force microscopy; biomolecular electronics; dielectric materials; leakage currents; nanocomposites; nanoparticles; ultraviolet spectra; γ-APTES; 3-aminopropyltriethoxysilane mixture; breakdown voltage; conductive atomic-force-microscopy; dielectric material; leakage current; mixing ratio; nanoscale leakage characterizations; post-UV irradiated membrane; silica nanoparticles bionanocomposite; Biomembranes; Biosensors; Leakage current; Lighting; Nanobioscience; Silicon compounds; 3-aminopropyltriethoxysilane; atomic-force-microscopy; leakage; polydimethylsiloxane; post-UV;
Conference_Titel :
Electron Devices and Solid-State Circuits (EDSSC), 2011 International Conference of
Conference_Location :
Tianjin
Print_ISBN :
978-1-4577-1998-1
Electronic_ISBN :
Pending
DOI :
10.1109/EDSSC.2011.6117608
