Title :
Silicon-based Packaging Platform for Light Emitting Diode
Author :
Tsou, C. ; Huang, Y.S. ; Lin, G.W.
Author_Institution :
Dept. of Autom. Control Eng., Feng Chia Univ., Taichung
Abstract :
In this paper, we demonstrate a silicon-based packaging platform for a package component of light emitting diode (LED) by silicon bulk micromachining technologies and using a silicon substrate with embedded solder interconnections to dissipate heat and match thermal expansion coefficient (CTE). The objective is to develop an LED package that can overcome LED life, high operating voltage, package degradation and the ability to drive the devices at higher power and higher brightness. To numerically predict the performance of packaging design, the optical and thermal characterization of the novel package structure was simulated by TracePro and ANSYS software, respectively. Research results have shown that silicon substrate can enhance heat removal for safe junction temperature operation and minimize thermal stress caused by mismatch of CTE. Moreover, silicon-based packaging platform with embedded solder interconnections has been fabricated and can be used for packaging MEMS and conventional optoelectronic semiconductor devices
Keywords :
light emitting diodes; micromachining; micromechanical devices; semiconductor device metallisation; semiconductor device packaging; silicon; soldering; substrates; thermal management (packaging); thermal stresses; ANSYS software; LED package; MEMS packaging; TracePro; embedded solder interconnection; light emitting diode; optoelectronic semiconductor device; packaging design; silicon bulk micromachining; silicon-based packaging platform; thermal expansion coefficient; thermal stress; Light emitting diodes; Micromachining; Semiconductor device packaging; Silicon; Software packages; Substrates; Thermal degradation; Thermal expansion; Thermal stresses; Voltage;
Conference_Titel :
Electronic Packaging Technology, 2005 6th International Conference on
Conference_Location :
Shenzhen
Print_ISBN :
0-7803-9449-6
DOI :
10.1109/ICEPT.2005.1564668