• DocumentCode
    2849457
  • Title

    The Future of Charge Trapping Memories

  • Author

    Mikolajick, T. ; Specht, M. ; Nagel, N. ; Mueller, T. ; Riedel, S. ; Beug, F. ; Melde, T. ; Küsters, K.H.

  • Author_Institution
    Tech. Univ. of Freiberg, Freiberg
  • fYear
    2007
  • fDate
    23-25 April 2007
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Floating gate memory cells running into scaling limitations caused by reduced gate coupling and excessive floating gate interference, charge trapping in its two variants multi bit charge trapping and charge trapping NAND is the most promising technology for the mid term. For NOR type applications also phase change RAM could appear as a competitor in a few years, but some considerable development is still down the road. Concepts to challenge NAND type applications are still in the early stage. Therefore charge trapping is expected to be the technology of choice for code storage in the short to mid term and for data storage in the mid term timeframe.
  • Keywords
    NAND circuits; NOR circuits; electron traps; integrated logic circuits; integrated memory circuits; random-access storage; NOR type applications; charge trapping NAND; charge trapping memories; floating gate interference; floating gate memory cells; gate coupling reduction; multibit charge trapping; phase change RAM; EPROM; Electron traps; Flash memory; Hot carriers; Interference; Material storage; Nonvolatile memory; Silicon; Transistors; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, Systems and Applications, 2007. VLSI-TSA 2007. International Symposium on
  • Conference_Location
    Hsinchu
  • ISSN
    1524-766X
  • Print_ISBN
    1-4244-0584-X
  • Electronic_ISBN
    1524-766X
  • Type

    conf

  • DOI
    10.1109/VTSA.2007.378943
  • Filename
    4239511