Title :
Impurity distribution in high efficiency silicon trapatt devices
Author_Institution :
RCA Laboratories, Princeton, NJ, USA
Abstract :
Lists informal discussion sessions held at the conference proceedings.
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1970 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1970.1154831
