• DocumentCode
    2849629
  • Title

    Digital image correlation for analyzing portable electronic products during drop impact tests

  • Author

    Scheijgrond, P.L.W. ; Shi, D.X.Q. ; van Driel, W.D. ; Zhang, G.Q. ; Nijmeijer, H.

  • Author_Institution
    Dept. of Mech. Eng., Eindhoven Univ. of Technol., Netherlands
  • fYear
    2005
  • fDate
    30 Aug.-2 Sept. 2005
  • Firstpage
    121
  • Lastpage
    126
  • Abstract
    In this paper the feasibility to analyze a guided free fall drop of portable electronic products by optical inspection using digital image correlation is studied. This technology can examine the product on every arbitrary place on its surface and allows the product to make guided free fall drops. For this study, a mobile phone is dropped on a pavement stone under different orientations and heights. The phone is prepared with a speckle and the impact is recorded by using a high-speed camera. A custom made program based on digital image correlation is used to calculate the displacement fields during the impact. Out of these results deformations, strains, G-levels, velocities, energy losses, rotations and bending are calculated. Both local and global phenomena are measured and different impact orientations and heights are examined. The results provide new insights in drop test performance.
  • Keywords
    automatic optical inspection; cameras; displacement measurement; electronic products; impact testing; mobile handsets; reliability; custom made program; digital image correlation; displacement fields; drop impact tests; drop test performance; guided free fall drop; high-speed camera; impact orientations; mobile phone; optical inspection; pavement stone; portable electronic products; Adaptive optics; Cameras; Capacitive sensors; Digital images; Electronic equipment testing; High speed optical techniques; Image analysis; Inspection; Mobile handsets; Speckle;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology, 2005 6th International Conference on
  • Print_ISBN
    0-7803-9449-6
  • Type

    conf

  • DOI
    10.1109/ICEPT.2005.1564683
  • Filename
    1564683