DocumentCode :
2849659
Title :
Bean Moisture Content´s Measurement Based on RBF Neural Network
Author :
Zhen, Jianju ; Liu, Mingliang ; Sun, Laijun ; Qian, Haibo
Author_Institution :
Key Lab. of Electron. Eng., Heilongjiang Univ., Harbin, China
Volume :
2
fYear :
2010
fDate :
13-14 Oct. 2010
Firstpage :
862
Lastpage :
865
Abstract :
In the process of moisture content´s measurement with microwave resonant cavity based on RBF (radial basis function) neural network, the relationship among resonant frequency, quality factor and environmental temperature (the inputs of network) and moisture content (the output of network) is multiple non-linear. The performance of multiple non-linear regression algorithm is the major factor that determines the accuracy of measurement. A regression algorithm based on a RBF neural network is put forward to improve the measurement result in this paper. The RBF neural network regression algorithm can effectively avoid the BP algorithm disadvantages such as getting into local minimum and the low efficiency, and has the advantages such as high generalization precision and rapid convergence. Consequently, the measurement accuracy is enhanced. In this paper, experimental results show that the high-precision measurement value of moisture content can be obtained with the multiple non-linear regression algorithm based on RBF neural network.
Keywords :
agricultural products; backpropagation; cavity resonators; microwave devices; microwave measurement; moisture measurement; radial basis function networks; regression analysis; BP algorithm; RBF neural network; bean moisture content measurement; environmental temperature; high-precision measurement; microwave resonant cavity; multiple nonlinear regression algorithm; radial basis function network; Artificial neural networks; Materials; Microwave measurements; Microwave theory and techniques; Moisture; Moisture measurement; Radial basis function networks; microwave resonant cavity; moisture content; neural network; radial basis function network;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent System Design and Engineering Application (ISDEA), 2010 International Conference on
Conference_Location :
Changsha
Print_ISBN :
978-1-4244-8333-4
Type :
conf
DOI :
10.1109/ISDEA.2010.114
Filename :
5743543
Link To Document :
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