DocumentCode :
2849768
Title :
Effect of Mg on the Microstructure and Properties of Sn-Ag-Cu Lead-free Solder
Author :
Sheng, Lu ; Chenggang, Wei
Author_Institution :
Dept. of Welding & Mater. Forming, Jiangsu Univ. of Sci. & Technol.
fYear :
2005
fDate :
2-2 Sept. 2005
Firstpage :
1
Lastpage :
4
Abstract :
In this paper, a SnAgCuMg solder alloy system was developed considering its potential as a direct substitute for Sn-Pb solder for electronic assembly. Ingots with additive 1%5 3% and 5% (wt ) Mg to an eutectic Sn-4.0Ag-0.5Cu alloy were cast by means of a resistance furnace. To reduce the oxidation tendency of magnesium during melting and casting process, a special device was employed. The melting characteristic of SnAgCuMg solders was evaluated and compared with Sn-4.0Ag-0.5Cu alloy by differential thermal analysis (DTA). The microstructure observation was carried out by means of optical microscopy (OM) and scanning electron microscopy (SEM). It showed that SnAgCu solder tends to melt at lower temperature with the addition of Mg. Without typical Ag3Sn/beta-Sn eutectic microstructure, SnAgCuMg solders present different microstructures from eutectic Sn-4.0Ag-0.5Cu. Some Sn, Ag, Mg-rich polygons were found among beta-Sn matrix of SnAgCuMg solders by energy dispersed spectrum (EDS)
Keywords :
copper alloys; magnesium; materials testing; optical microscopy; scanning electron microscopy; silver alloys; solders; thermal analysis; tin alloys; Mg; SnAgCu; differential thermal analysis; electronic assembly; lead-free solder; optical microscopy; scanning electron microscopy; Additives; Assembly systems; Environmentally friendly manufacturing techniques; Furnaces; Lead; Microstructure; Optical microscopy; Oxidation; Scanning electron microscopy; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology, 2005 6th International Conference on
Conference_Location :
Shenzhen
Print_ISBN :
0-7803-9449-6
Type :
conf
DOI :
10.1109/ICEPT.2005.1564690
Filename :
1564690
Link To Document :
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