DocumentCode :
2849812
Title :
Exploring the Logic and Developing New Classification Methods in Attribute Hierarchy Model
Author :
Mao, Mengmeng ; Ding, Shuliang
Author_Institution :
Coll. of Psychol., Jiang Xi Normal Univ., Nanchang, China
fYear :
2009
fDate :
11-13 Dec. 2009
Firstpage :
1
Lastpage :
4
Abstract :
Two new similarity indexes are introduced to explain the logic behind the classification methods A and B with attribute hierarchy model. Several kinds of new classification methods proposed are based on variations of the similarity between the expected response pattern and the observed response pattern. The results of simulation indicate that the new methods are better than methods A and B. And with the slips increasing the advantage is especially obvious.
Keywords :
pattern classification; attribute hierarchy model; classification methods; expected response pattern; observed response pattern; similarity indexes; Computational modeling; Educational institutions; Enterprise resource planning; Logic; Logistics; Pattern matching; Probability; Psychology; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computational Intelligence and Software Engineering, 2009. CiSE 2009. International Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-4507-3
Electronic_ISBN :
978-1-4244-4507-3
Type :
conf
DOI :
10.1109/CISE.2009.5365312
Filename :
5365312
Link To Document :
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