Title :
A BIST scheme to test static parameters of ADCs
Author :
Hongyu, Zhu ; Huiyun Li
Author_Institution :
Shenzhen Inst. of Adv. Technol., Chinese Univ. of Hong Kong, Shenzhen, China
Abstract :
This paper presents a Built-in Self-Test (BIST) scheme for testing Analog-to-Digital Converters (ADCs) static parameters, including Offset Error, Gain Error, Integral Non-linearity (INL) and Differential Non-linearity (DNL). The main components of the proposed BIST contain a Controller, a Test Pattern Generator (TPG), a Output Response Analyzer (ORA) and a Counter. The ramp signal is used as the stimulus, generated by TPG, Digital-to-Analog Converters (DACs) and filter. The function of filter is to eliminate the effect of DAC transition error to ramp stimulus signal. The correct synchronization between the ramp stimulus and the counter output codes is achieved, and then used by ORA to detect INL and DNL. The experimental results obtained by LabVIEW simulating indicate that thi.
Keywords :
analogue-digital conversion; automatic testing; controllers; synchronisation; virtual instrumentation; ADC test static parameter; BIST scheme; DAC transition error; LabVIEW; analog-digital converter static parameter; built-in self-test scheme; controller; counter; counter output code; differential nonlinearity; filter; gain error; integral nonlinearity; offset error; output response analyzer; ramp stimulus signal; synchronization; test pattern generator; Radiation detectors; ADC; BIST; DNL; INL; Ramp;
Conference_Titel :
Electrical & Electronics Engineering (EEESYM), 2012 IEEE Symposium on
Conference_Location :
Kuala Lumpur
Print_ISBN :
978-1-4673-2363-5
DOI :
10.1109/EEESym.2012.6258600
