Title :
Monte Carlo analysis of a 2nd-order curvature-compensated CMOS bandgap voltage reference
Author :
Song, Yiwei ; Zhao, Yiqiang ; Geng, Junfeng ; Gao, Jing
Author_Institution :
Sch. of Electron. Inf. Eng., Tianjin Univ., Tianjin, China
Abstract :
This work presents a 2nd-order curvature-compensated CMOS bandgap voltage reference, which utilizes the constant current technique. Monte Carlo analysis is done to estimate the performance impact from the process variation and device mismatch. Finally, the circuit is implemented in a standard 0.18 μm CMOS process. The measurement results have confirmed that the proposed bandgap voltage reference operates with a supply voltage of 1.8 V, consuming 52 μW at room temperature (25 °C), and the temperature coefficient of the output voltage reference is about 8 ppm/°C from -40 °C to 125 °C. The measured power supply rejection ratio is -42 dB at 1 kHz.
Keywords :
CMOS integrated circuits; Monte Carlo methods; constant current sources; reference circuits; 2nd-order curvature-compensated CMOS bandgap voltage reference; CMOS process; Monte Carlo analysis; constant current technique; device mismatch; frequency 1 kHz; gain -42 dB; power 52 muW; power supply rejection ratio; process variation; size 0.18 mum; temperature -40 degC to 125 degC; temperature 293 K to 298 K; voltage 1.8 V; Bipolar transistors; CMOS integrated circuits; Monte Carlo methods; Photonic band gap; Resistors; Temperature measurement; Voltage measurement; Monte Carlo analysis; bandgap voltage reference; constant current technique; curvature compensated;
Conference_Titel :
Electron Devices and Solid-State Circuits (EDSSC), 2011 International Conference of
Conference_Location :
Tianjin
Print_ISBN :
978-1-4577-1998-1
Electronic_ISBN :
Pending
DOI :
10.1109/EDSSC.2011.6117654
