DocumentCode :
2850651
Title :
Mechanical Test and Analysis on Reliability of Lead-free BGA Assembly
Author :
Zhu, XiaoKun ; Qi, Bo ; Qu, Xin ; Wang, Jiaji ; Lee, Taekoo ; Wang, Hui
Author_Institution :
Fudan-Sumsung Packaging Reliability Joint Lab, Fudan Univ., Shanghai
fYear :
2005
fDate :
2-2 Sept. 2005
Firstpage :
1
Lastpage :
5
Abstract :
As environment pollution and health problem became more and more seriously concerned, the electronic packaging industry is facing the challenge of changeover to "green", using the lead-free solder alloy is the trend instead of the traditional 63Sn/37Pb solder. In this paper, a PCB-level drop test for BGA package will be introduced and the mechanism of the solder joint mechanical fatigue failure will be discussed in detail, in order to find out the relevant failure root causes. In addition, comparing the difference between the solder joint performance of lead-free and PbSn BGA package, the reliability of the lead-free one can be evaluated and a feedback link to the lead-free material selections and processing parameters improving will be provided
Keywords :
ball grid arrays; fatigue testing; integrated circuit packaging; integrated circuit reliability; lead alloys; solders; tin alloys; PbSn; ball grid array assembly; electronic packaging; environment pollution; health problem; lead-free solder alloy; mechanical fatigue failure; Assembly; Electronics industry; Electronics packaging; Environmentally friendly manufacturing techniques; Fatigue; Industrial pollution; Lead; Soldering; Testing; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology, 2005 6th International Conference on
Conference_Location :
Shenzhen
Print_ISBN :
0-7803-9449-6
Type :
conf
DOI :
10.1109/ICEPT.2005.1564746
Filename :
1564746
Link To Document :
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