• DocumentCode
    2850775
  • Title

    Skyworks capacitor model for ESD applications

  • Author

    Yin, Hong ; Zhu, Yu ; Wei, Cejun ; Klimashov, Alex ; Bartle, Dylan

  • Author_Institution
    Skyworks Solutions, Inc., Woburn, MA, USA
  • fYear
    2011
  • fDate
    17-18 Nov. 2011
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    The Skyworks Capacitor model for ESD applications is described and discussed. A Skyworks ESD Capacitor is modeled as an ideal capacitor in parallel with a leakage current source, along with a resistor to the ground modeling the substrate leakage at each terminal. The current-voltage and small-signal characteristics predicted by the model coincide with measurement results. Furthermore, by employing the Human-Body Model (HBM), an ESD simulation environment is set up in order to simulate ESD tests on Skyworks ESD Capacitors. The breakdown criteria of two kinds of Skyworks ESD Capacitors are investigated and the corresponding model is investigated and developed based on experimental data.
  • Keywords
    capacitors; ESD application; ESD simulation environment; Skyworks ESD capacitor model; current-voltage; ground modeling; human-body model; leakage current source; substrate leakage; Breakdown voltage; Capacitors; Current measurement; Electrostatic discharges; Integrated circuit modeling; Leakage current; Semiconductor device modeling; ESD capacitors; Human Body Model(HBM); breakdown;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices and Solid-State Circuits (EDSSC), 2011 International Conference of
  • Conference_Location
    Tianjin
  • ISSN
    Pending
  • Print_ISBN
    978-1-4577-1998-1
  • Electronic_ISBN
    Pending
  • Type

    conf

  • DOI
    10.1109/EDSSC.2011.6117682
  • Filename
    6117682