• DocumentCode
    2850898
  • Title

    Evolutionary generation of test data for many paths coverage

  • Author

    Zhang, Wan-Qiu ; Gong, Dun-Wei ; Yao, Xiang-Juan ; Zhang, Yan

  • Author_Institution
    Sch. of Inf. & Electr. Eng., China Univ. of Min. & Technol., Xuzhou, China
  • fYear
    2010
  • fDate
    26-28 May 2010
  • Firstpage
    230
  • Lastpage
    235
  • Abstract
    Generation of test data for path coverage is an important issue of software testing, but previous methods are only suitable for the case that a program only has a small number of paths. We focus on the problem of generating test data for many paths coverage in this paper, and present a method of evolutionary generation of test data for many paths coverage. First, target paths are divided into several groups based on their similarity, and each group forms a sub-optimization problem, which transforms a complicated optimization problem into several simpler sub-optimization problems; then a domain-based fitness is designed when genetic algorithms are employed to solve these problems; finally, these sub-optimization problems are simplified along with the process of generating test data, hence improving the efficiency of generating test data. Our method is applied in 2 benchmark programs, and compared with some previous methods. The experimental results show that our method has advantage in time-consumption and the number of uncovered target paths. Our achievement provides an efficient way for generating test data of complicated software.
  • Keywords
    genetic algorithms; program debugging; program testing; genetic algorithm; optimization; paths coverage; software testing; test data generation; Algorithm design and analysis; Benchmark testing; Computer bugs; Computer science; Costs; Design optimization; Educational institutions; Genetic algorithms; Software reliability; Software testing; genetic algorithms; grouping; many paths coverage; software testing; test data;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Control and Decision Conference (CCDC), 2010 Chinese
  • Conference_Location
    Xuzhou
  • Print_ISBN
    978-1-4244-5181-4
  • Electronic_ISBN
    978-1-4244-5182-1
  • Type

    conf

  • DOI
    10.1109/CCDC.2010.5499081
  • Filename
    5499081