DocumentCode
2851099
Title
An Investigation on Capacitive Coupling in RAM Address Decoders
Author
Hamdioui, Said ; AL-Ars, Zaid ; Gaydadjiev, Georgi N. ; Van de Goor, Ad J.
Author_Institution
Delft Univ. of Technol., Delft
fYear
2007
fDate
16-18 Dec. 2007
Firstpage
9
Lastpage
14
Abstract
In this paper, a complete analysis of address decoder delay faults due to capacitive coupling between address lines is presented. Detection conditions are used to explore the space of possible tests in order to detect these faults, resulting in new tests. The best test is proposed to be combined with other tests (while using the freedom of march tests) to target other faults.
Keywords
codecs; fault diagnosis; logic testing; random-access storage; storage allocation; RAM address decoders; address decoder delay faults; capacitive coupling; fault detection conditions; Bridge circuits; Circuit faults; Crosstalk; Decoding; Delay; Fault detection; Random access memory; Space exploration; Space technology; Testing; address decoder faults; capacitive coupling; delay faults; memory testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design and Test Workshop, 2007. IDT 2007. 2nd International
Conference_Location
Cairo
Print_ISBN
978-1-4244-1824-4
Electronic_ISBN
978-1-4244-1825-1
Type
conf
DOI
10.1109/IDT.2007.4437418
Filename
4437418
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