Title :
AITEST: A Real Life Expert System for Fault Detection and Isolation in Electronic Equipment
Author :
Bassat, M.B. ; Ben-Arie, Daphna ; Cheifetz, J. ; Klinger, Jonathan Cheifetz Mordechal
Author_Institution :
Tel Aviv University
Keywords :
Automatic testing; Costs; Electronic equipment; Engines; Expert systems; Fault detection; Fault diagnosis; Large-scale systems; System testing; Tellurium;
Conference_Titel :
Systems, Man, and Cybernetics, 1988. Proceedings of the 1988 IEEE International Conference on
Print_ISBN :
7-80003-039-3
DOI :
10.1109/ICSMC.1988.712871
