DocumentCode :
2852101
Title :
Impact of Current Crest Factor at High and Low Frequency Operation on Fluorescent Lamp Electrodes
Author :
Kaiser, Walter ; Marques, Ricardo Paulino ; Correa, Alexander Fernandez
Author_Institution :
Escola Politecnica da Univ. de Sao Paulo
Volume :
1
fYear :
2006
fDate :
8-12 Oct. 2006
Firstpage :
236
Lastpage :
241
Abstract :
The current crest factor (CCF) is a measure of wave shape distortion and indicates the potential for high peak current, which can damage the lamp electrode and reduce lamp life. The value of 1.7, which is regarded as an acceptable limit by the American National Standards Institute (ANSI) and International Electricity Commission (IEC) ballast performance standards is based on 50/60 Hz operation. High frequency operation involves different electrode operating conditions and the validity of this limit could be questionable. This paper evaluates the relative effect of waveform distortions at high-frequency and the low frequency amplitude modulation of high frequency sinusoidal waveforms on electrode emitter depletion with respect to 60 Hz sinusoidal current steady state operation. The emission of electrode mix is evaluated by barium line measurements and cathode fall monitoring on special-made lamps with clear ends
Keywords :
amplitude modulation; distortion; fluorescent lamps; 60 Hz; ANSI; American National Standards Institute; IEC; International Electricity Commission; amplitude modulation; ballast performance standards; barium emission; barium line measurements; cathode fall monitoring; current crest factor; electrode emitter depletion; electrode mix emission; fluorescent lamp electrodes; high frequency sinusoidal waveforms; sinusoidal current; steady state operation; wave shape distortion; ANSI standards; Amplitude modulation; Current measurement; Distortion measurement; Electrodes; Electronic ballasts; Fluorescent lamps; Frequency; IEC standards; Shape measurement; Barium emission; Cathode fall; Crest-factor; Electrodes; Fluorescent lamp;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Conference, 2006. 41st IAS Annual Meeting. Conference Record of the 2006 IEEE
Conference_Location :
Tampa, FL
ISSN :
0197-2618
Print_ISBN :
1-4244-0364-2
Electronic_ISBN :
0197-2618
Type :
conf
DOI :
10.1109/IAS.2006.256529
Filename :
4025214
Link To Document :
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