DocumentCode
2852144
Title
Frequency Diagnostic Universal Fault Protection for Current Fed Parallel Electronic Resonant Ballast
Author
Yu, Qinghong ; Parisella, Joe
Author_Institution
Electron. Control Syst., Osram Sylvania, Beverly, MA
Volume
1
fYear
2006
fDate
8-12 Oct. 2006
Firstpage
257
Lastpage
264
Abstract
Current fed parallel resonant electronic ballasts (PREB) dominate the applications for the T8 fluorescent lamp in North America for the advantage of low cost, flexibility and high reliability. At fault condition, PREB generates much heat externally, but it is difficult to provide fault protection using traditional approaches without sacrificing other advantages of PREB. In this paper, a digital solution is presented to detect universal fault condition in PREB and preserve its other advantages. Analysis of the operational principal shows that the load impedance disturbance in PREB leads to operation frequency perturbation, which can be detected with a very simple and low cost digital device for fault protections. Experiments show that this frequency diagnostic provides very sensitive and reliable fault detection for PREB. With both end-of-life and anti-arcing protections solved with one algorithm, this technology provides a superior fault protection to one of the most widely used ballast topologies and greatly extends the potential applications of PREB in modern lighting industry
Keywords
arcs (electric); digital circuits; fluorescent lamps; lamp accessories; lighting; overcurrent protection; North America; T8 fluorescent lamp; anti-arcing protections; current fed parallel electronic resonant ballast; digital device; electronic ballast; end-of-life protection; frequency diagnostic; load impedance disturbance; operation frequency perturbation; self-oscillation inverter; universal fault protection; Costs; Electronic ballasts; Fault detection; Fluorescent lamps; Frequency; Impedance; North America; Protection; Resonance; Topology; Electronic ballast; fault protection; self-oscillation inverter;
fLanguage
English
Publisher
ieee
Conference_Titel
Industry Applications Conference, 2006. 41st IAS Annual Meeting. Conference Record of the 2006 IEEE
Conference_Location
Tampa, FL
ISSN
0197-2618
Print_ISBN
1-4244-0364-2
Electronic_ISBN
0197-2618
Type
conf
DOI
10.1109/IAS.2006.256533
Filename
4025218
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