DocumentCode :
2852168
Title :
What do we know about the defect types detected in conceptual models?
Author :
Granda, Maria Fernanda ; Condori-Fernandez, Nelly ; Vos, Tanja E. J. ; Pastor, Oscar
Author_Institution :
Dept. of Comput. Sci., Univ. of Cuenca, Cuenca, Ecuador
fYear :
2015
fDate :
13-15 May 2015
Firstpage :
88
Lastpage :
99
Abstract :
In Model-Driven Development (MDD), defects are managed at the level of conceptual models because the other artefacts are generated from them, such as more refined models, test cases and code. Although some studies have reported on defect types at model level, there still does not exist a clear and complete overview of the defect types that occur at the abstraction level. This paper presents a systematic mapping study to identify the model defect types reported in the literature and determine how they have been detected. Among the 282 articles published in software engineering area, 28 articles were selected for analysis. A total of 226 defects were identified, classified and their results analysed. For this, an appropriate defect classification scheme was built based on appropriate dimensions for models in an MDD context.
Keywords :
pattern classification; program debugging; software engineering; MDD; abstraction level; conceptual model; defect classification scheme; defect types; model-driven development; software engineering area; systematic mapping; Adaptation models; Cascading style sheets; Object oriented modeling; Software; Standards; Systematics; Unified modeling language; Conceptual Schema Defects; Defect Classification Scheme; Model-Driven Development; Systematic Mapping Study;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Research Challenges in Information Science (RCIS), 2015 IEEE 9th International Conference on
Conference_Location :
Athens
Type :
conf
DOI :
10.1109/RCIS.2015.7128867
Filename :
7128867
Link To Document :
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