• DocumentCode
    2852168
  • Title

    What do we know about the defect types detected in conceptual models?

  • Author

    Granda, Maria Fernanda ; Condori-Fernandez, Nelly ; Vos, Tanja E. J. ; Pastor, Oscar

  • Author_Institution
    Dept. of Comput. Sci., Univ. of Cuenca, Cuenca, Ecuador
  • fYear
    2015
  • fDate
    13-15 May 2015
  • Firstpage
    88
  • Lastpage
    99
  • Abstract
    In Model-Driven Development (MDD), defects are managed at the level of conceptual models because the other artefacts are generated from them, such as more refined models, test cases and code. Although some studies have reported on defect types at model level, there still does not exist a clear and complete overview of the defect types that occur at the abstraction level. This paper presents a systematic mapping study to identify the model defect types reported in the literature and determine how they have been detected. Among the 282 articles published in software engineering area, 28 articles were selected for analysis. A total of 226 defects were identified, classified and their results analysed. For this, an appropriate defect classification scheme was built based on appropriate dimensions for models in an MDD context.
  • Keywords
    pattern classification; program debugging; software engineering; MDD; abstraction level; conceptual model; defect classification scheme; defect types; model-driven development; software engineering area; systematic mapping; Adaptation models; Cascading style sheets; Object oriented modeling; Software; Standards; Systematics; Unified modeling language; Conceptual Schema Defects; Defect Classification Scheme; Model-Driven Development; Systematic Mapping Study;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Research Challenges in Information Science (RCIS), 2015 IEEE 9th International Conference on
  • Conference_Location
    Athens
  • Type

    conf

  • DOI
    10.1109/RCIS.2015.7128867
  • Filename
    7128867