Title :
Bipolar LSI for a main memory
Author :
Gates, H. ; McKinney, Jason ; North, W.
Author_Institution :
IBM Components Div., Hopewell Junction, NY, USA
Abstract :
The design, process and characterization of a bipolar main memory, with a basic 512-bit module containing four chips with decode and sense circuits will be discussed, citing innovations in CAD, mask generation and testing required.
Keywords :
Character generation; Circuit testing; Documentation; Electromigration; Fatigue; Large scale integration; Process design; Production; Voltage;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1971 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1971.1154982
