• DocumentCode
    2852199
  • Title

    Bipolar LSI for a main memory

  • Author

    Gates, H. ; McKinney, Jason ; North, W.

  • Author_Institution
    IBM Components Div., Hopewell Junction, NY, USA
  • Volume
    XIV
  • fYear
    1971
  • fDate
    17-19 Feb. 1971
  • Firstpage
    78
  • Lastpage
    79
  • Abstract
    The design, process and characterization of a bipolar main memory, with a basic 512-bit module containing four chips with decode and sense circuits will be discussed, citing innovations in CAD, mask generation and testing required.
  • Keywords
    Character generation; Circuit testing; Documentation; Electromigration; Fatigue; Large scale integration; Process design; Production; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1971 IEEE International
  • Conference_Location
    Philadelphia, PA, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1971.1154982
  • Filename
    1154982
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2852199