• DocumentCode
    2852413
  • Title

    Design possibilities for photodiode arrays with integral silicon-gate scan generators

  • Author

    Weckler, G. ; Dyck, R.

  • Author_Institution
    Fairchild Research and Development Lab., Palo Alto, CA, USA
  • Volume
    XIV
  • fYear
    1971
  • fDate
    17-19 Feb. 1971
  • Firstpage
    130
  • Lastpage
    131
  • Abstract
    A RECENTLY-DESCRIBED single-dimension self-scanning photodiode array has been seminal to a growing number of modified structures for a variety of applications. The MOS shift register, which controls array scanning, has in particular demonstrated considerable versatility and applicability for different array designs. This paper will discuss the tradeoffs in shift register and photodiode structure which set the limits on array performance.
  • Keywords
    Capacitance; Charge transfer; Clocks; Diodes; FETs; Impedance; Photodiodes; Sampling methods; Sensor arrays; Shift registers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1971 IEEE International
  • Conference_Location
    Philadelphia, PA, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1971.1154996
  • Filename
    1154996
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2852413