Title :
Design possibilities for photodiode arrays with integral silicon-gate scan generators
Author :
Weckler, G. ; Dyck, R.
Author_Institution :
Fairchild Research and Development Lab., Palo Alto, CA, USA
Abstract :
A RECENTLY-DESCRIBED single-dimension self-scanning photodiode array has been seminal to a growing number of modified structures for a variety of applications. The MOS shift register, which controls array scanning, has in particular demonstrated considerable versatility and applicability for different array designs. This paper will discuss the tradeoffs in shift register and photodiode structure which set the limits on array performance.
Keywords :
Capacitance; Charge transfer; Clocks; Diodes; FETs; Impedance; Photodiodes; Sampling methods; Sensor arrays; Shift registers;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1971 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1971.1154996
