Title :
New methods for receiver internal jitter measurement
Author :
Li, Mike P. ; Chen, Jinhua
Author_Institution :
Wavecrest Corp., San Jose, CA
Abstract :
We have developed three receiver internal deterministic jitter (DJ) and random jitter (RJ) measurement methods through external DJ stressing, RJ stressing, or sampling time shifting. High throughput jitter tolerance tests utilizing the receiver internal DJ and RJ are presented. Analytical formulas for receiver DJ and RJ estimation have been developed. Relevant simulations and laboratory experiments have been conducted and the validity for the methods has been verified. We have also shown that a 6 orders of magnitude reduction in test time can be achieved with a good statistical confidence with the proposed methods.
Keywords :
electric variables measurement; jitter; receivers; synchronisation; tolerance analysis; chip-to-chip interconnections; external deterministic jitter stressing; high throughput jitter tolerance tests; random jitter measurement methods; random jitter stressing; receiver internal jitter measurements; sampling time shifting; Application software; Bit error rate; Circuits; Clocks; Computer architecture; Jitter; Operating systems; Phase locked loops; Stress measurement; Transmitters;
Conference_Titel :
Test Conference, 2007. ITC 2007. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-1127-6
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2007.4437570
