DocumentCode :
2852845
Title :
Low latency demodulation for Atomic Force Microscopes, Part I efficient real-time integration
Author :
Abramovitch, D.Y.
Author_Institution :
Nanotechnol. Group, Agilent Labs., Santa Clara, CA, USA
fYear :
2011
fDate :
June 29 2011-July 1 2011
Firstpage :
2252
Lastpage :
2257
Abstract :
This paper describes methods for doing high speed, low latency, coherent demodulation of signals for dynamic or AC mode in Atomic Force Microscopes (AFMs) [1]. These demodulation methods allow the system to extract signal information in as little as one cycle of the fundamental oscillation frequency. By having so little latency, the demodulator minimizes the time delay in the servo loop for an AC mode AFM. This in turn minimizes the negative phase effects of the demodulation allowing for higher speed scanning. This part of the paper describes the mixing and integration portion of the demodulator. Part II [2] describes efficient methods for extracting magnitude and phase in real time.
Keywords :
atomic force microscopy; delays; demodulators; oscillations; servomechanisms; AC mode AFM; atomic force microscopes; fundamental oscillation frequency; low latency demodulation; negative phase effects; real-time integration; servo loop; time delay; Demodulation; Equations; Finite impulse response filter; Optical surface waves; Oscillators; Resonant frequency; Surface topography;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
American Control Conference (ACC), 2011
Conference_Location :
San Francisco, CA
ISSN :
0743-1619
Print_ISBN :
978-1-4577-0080-4
Type :
conf
DOI :
10.1109/ACC.2011.5991144
Filename :
5991144
Link To Document :
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