• DocumentCode
    2852845
  • Title

    Low latency demodulation for Atomic Force Microscopes, Part I efficient real-time integration

  • Author

    Abramovitch, D.Y.

  • Author_Institution
    Nanotechnol. Group, Agilent Labs., Santa Clara, CA, USA
  • fYear
    2011
  • fDate
    June 29 2011-July 1 2011
  • Firstpage
    2252
  • Lastpage
    2257
  • Abstract
    This paper describes methods for doing high speed, low latency, coherent demodulation of signals for dynamic or AC mode in Atomic Force Microscopes (AFMs) [1]. These demodulation methods allow the system to extract signal information in as little as one cycle of the fundamental oscillation frequency. By having so little latency, the demodulator minimizes the time delay in the servo loop for an AC mode AFM. This in turn minimizes the negative phase effects of the demodulation allowing for higher speed scanning. This part of the paper describes the mixing and integration portion of the demodulator. Part II [2] describes efficient methods for extracting magnitude and phase in real time.
  • Keywords
    atomic force microscopy; delays; demodulators; oscillations; servomechanisms; AC mode AFM; atomic force microscopes; fundamental oscillation frequency; low latency demodulation; negative phase effects; real-time integration; servo loop; time delay; Demodulation; Equations; Finite impulse response filter; Optical surface waves; Oscillators; Resonant frequency; Surface topography;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference (ACC), 2011
  • Conference_Location
    San Francisco, CA
  • ISSN
    0743-1619
  • Print_ISBN
    978-1-4577-0080-4
  • Type

    conf

  • DOI
    10.1109/ACC.2011.5991144
  • Filename
    5991144