• DocumentCode
    2852905
  • Title

    Design for test features of the ARM clock control macro

  • Author

    Frederick, Frank ; McLaurin, Teresa

  • Author_Institution
    ARM, Austin, TX
  • fYear
    2007
  • fDate
    21-26 Oct. 2007
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    The ability to apply a slow shift clock and an at-speed capture or functional clock is required to keep the average power down during test. A clock control macro (CCM) that can be attached to a PLL has been designed to meet the functional and structural test clocking needs of the Cortextrade-A8 microprocessor core. This includes a glitchless multiplexer, the ability to control separate clocks in isolation and the ability to switch between the reference clock and the PLL VCO clock. This clock control macro is different from previous ARM CCMs in that it has extra capability and it was coded to be synthesizable for reuse.
  • Keywords
    automatic test pattern generation; clocks; integrated circuit testing; microprocessor chips; phase locked loops; voltage-controlled oscillators; ARM CCM; ARM clock control macro; ATPG; Cortextrade-A8 microprocessor core; PLL; PLL VCO clock; functional clock; glitchless multiplexer; microprocessor core; reference clock; slow shift clock; structural test clocking; test features; Automatic test pattern generation; Built-in self-test; Clocks; Frequency; Logic devices; Logic testing; Microprocessors; Phase locked loops; Switches; Voltage-controlled oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2007. ITC 2007. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-1127-6
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2007.4437586
  • Filename
    4437586