DocumentCode :
2852905
Title :
Design for test features of the ARM clock control macro
Author :
Frederick, Frank ; McLaurin, Teresa
Author_Institution :
ARM, Austin, TX
fYear :
2007
fDate :
21-26 Oct. 2007
Firstpage :
1
Lastpage :
8
Abstract :
The ability to apply a slow shift clock and an at-speed capture or functional clock is required to keep the average power down during test. A clock control macro (CCM) that can be attached to a PLL has been designed to meet the functional and structural test clocking needs of the Cortextrade-A8 microprocessor core. This includes a glitchless multiplexer, the ability to control separate clocks in isolation and the ability to switch between the reference clock and the PLL VCO clock. This clock control macro is different from previous ARM CCMs in that it has extra capability and it was coded to be synthesizable for reuse.
Keywords :
automatic test pattern generation; clocks; integrated circuit testing; microprocessor chips; phase locked loops; voltage-controlled oscillators; ARM CCM; ARM clock control macro; ATPG; Cortextrade-A8 microprocessor core; PLL; PLL VCO clock; functional clock; glitchless multiplexer; microprocessor core; reference clock; slow shift clock; structural test clocking; test features; Automatic test pattern generation; Built-in self-test; Clocks; Frequency; Logic devices; Logic testing; Microprocessors; Phase locked loops; Switches; Voltage-controlled oscillators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2007. ITC 2007. IEEE International
Conference_Location :
Santa Clara, CA
ISSN :
1089-3539
Print_ISBN :
978-1-4244-1127-6
Electronic_ISBN :
1089-3539
Type :
conf
DOI :
10.1109/TEST.2007.4437586
Filename :
4437586
Link To Document :
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