Title :
The development of a top-bottom-BGA (TB-BGA)
Author :
Leutenbauer, Rudolf ; Grosser, Volker ; Michel, Bemd ; Reichl, Herbert
Author_Institution :
Dept. Mech. Reliability & Micro Mater., Fraunhofer Inst. FhG, Berlin, Germany
Abstract :
A “top-bottom ball grid array” (TB-BGA) is described which takes advantage of existing BGA and chip scale package (CSP) techniques to create a new package for SCMs, MCMs, sensors and actuators. By using a pin-compatible BGA configuration at the bottom and the top of the carrier, a 3D stack assembly of several TB-BGAs is possible. By considering thermomechanical reliability, the compact stack assembly reduces bending loads and shear forces by using suitable materials. The area configuration of solder balls ensures good thermal conductivity. As demonstration devices, ceramic TB-BGAs are developed as single chip modules (SCMs) and few chip modules (FCMs). They are mounted as intelligent sensor bus interfaces in conventional sensor casings. A fully operational 16 bit processor unit, including microcontroller, SRAM, EEPROM physical CAN bus interface, oscillator and SMD components, requires a volume of only 1.5 cm3
Keywords :
assembling; bending; integrated circuit packaging; integrated circuit reliability; multichip modules; soldering; surface mount technology; thermal conductivity; 16 bit; 3D TB-BGA stack assembly; EEPROM physical CAN bus interface; MCMs; SCMs; SMD components; SRAM; TB-BGA; actuator package; bending loads; ceramic TB-BGAs; chip scale package; few chip modules; intelligent sensor bus interfaces; microcontroller; modular vertical integration technique; oscillator; pin-compatible BGA configuration; processor unit; processor unit volume; sensor casings; sensor package; shear forces; single chip modules; solder ball area configuration; thermal conductivity; thermomechanical reliability; top-bottom ball grid array; top-bottom-BGA; Actuators; Assembly; Chip scale packaging; Electronics packaging; Intelligent sensors; Materials reliability; Sensor arrays; Sensor phenomena and characterization; Thermal conductivity; Thermomechanical processes;
Conference_Titel :
Multichip Modules and High Density Packaging, 1998. Proceedings. 1998 International Conference on
Conference_Location :
Denver, CO
Print_ISBN :
0-7803-4850-8
DOI :
10.1109/ICMCM.1998.670788