DocumentCode :
2852970
Title :
Separating temperature effects from ring-oscillator readings to measure true IR-drop on a chip
Author :
Abuhamdeh, Zahi ; Alassandro, Vincent D. ; Pico, Richard ; Montrone, Dale ; Crouch, Alfred ; Tracy, Andrew
Author_Institution :
TranSwitch Corp., Bedford, MA
fYear :
2007
fDate :
21-26 Oct. 2007
Firstpage :
1
Lastpage :
10
Abstract :
There have been numerous attempts at adding ring-oscillator counters to measure IR-Drop on chips. The difficulty with this approach has been that any reading of the ring count always combined the effects of Temperature and Voltage versus Voltage only reading. The technique relied primarily on the fact that temperature effects take a long time to affect the ring-oscillator counter value. This paper will validate this premise by using two identical ring-oscillator counters next to each other but powered by two separate power supplies. One ring-oscillator counter will be connected to the core under test, the second ring-oscillator counter will be connected to a clean supply. By comparing the different readings, we can accurately remove temperature from the ring-oscillator counter reading and arrive at an accurate IR-Drop measurement.
Keywords :
counting circuits; logic testing; oscillators; core under test; ring-oscillator counter; temperature effects; true IR-drop measurement; Capacitive sensors; Counting circuits; Logic; Power measurement; Power supplies; Ring oscillators; Semiconductor device measurement; Temperature measurement; Testing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2007. ITC 2007. IEEE International
Conference_Location :
Santa Clara, CA
ISSN :
1089-3539
Print_ISBN :
978-1-4244-1127-6
Electronic_ISBN :
1089-3539
Type :
conf
DOI :
10.1109/TEST.2007.4437591
Filename :
4437591
Link To Document :
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