Title :
Performance of a Distribution Intelligent Universal Transformer under Source and Load Disturbances
Author :
Lai, Jih-Sheng ; Maitra, Arindam ; Goodman, Frank
Author_Institution :
Future Energy Electron. Center, Virginia Polytech. Inst. & State Univ., Blacksburg, VA
Abstract :
A bench model of the new generation intelligent universal transformer (IUT) has been recently developed for distribution applications. The distribution IUT employs high-voltage semiconductor device technologies along with multilevel converter circuits for medium-voltage grid connection. This paper briefly describes the basic operation of the IUT and its experimental setup. Performances under source and load disturbances are characterized with extensive tests using a voltage sag generator and various linear and nonlinear loads. Experimental results demonstrate that IUT input and output can avoid direct impact from its opposite side disturbances. The output voltage is well regulated when the voltage sag is applied to the input. The input voltage and current maintains clean sinusoidal and unity power factor when output is nonlinear load. Under load transients, the input and output voltages remain well regulated. These key features prove that the power quality performance of IUT is far superior to that of conventional copper-and-iron based transformers
Keywords :
power convertors; power factor; power semiconductor devices; power supply quality; power system faults; power system transients; transformers; high-voltage semiconductor device; intelligent universal transformer; medium-voltage grid connection; multilevel converter circuits; power distribution; power quality; underload transients; unity power factor; voltage sag generator; Oil insulation; Performance evaluation; Power harmonic filters; Power quality; Power system harmonics; Power transformer insulation; Reactive power; Semiconductor devices; Solid state circuits; Voltage fluctuations; Distribution IUT; Intelligent Universal Transformer; Power Electronics; Power Quality;
Conference_Titel :
Industry Applications Conference, 2006. 41st IAS Annual Meeting. Conference Record of the 2006 IEEE
Conference_Location :
Tampa, FL
Print_ISBN :
1-4244-0364-2
Electronic_ISBN :
0197-2618
DOI :
10.1109/IAS.2006.256606