DocumentCode :
2853269
Title :
Resonant Body Transistors in IBM´s 32nm SOI CMOS technology
Author :
Marathe, Radhika ; Wang, W. ; Mahmood, Zohaib ; Daniel, Luca ; Weinstein, D.
Author_Institution :
Massachusetts Inst. of Technol., Cambridge, MA, USA
fYear :
2012
fDate :
1-4 Oct. 2012
Firstpage :
1
Lastpage :
2
Abstract :
This work presents an unreleased CMOS-integrated MEMS resonators fabricated at the transistor level of IBM´s 32SOI technology and realized without the need for any post-processing or packaging. These Resonant Body Transistors (RBTs) are driven capacitively and sensed piezoresistively using an n-channel Field Effect Transistor (nFET). Acoustic Bragg Reflectors (ABRs) are used to localize acoustic vibrations in these resonators completely buried in the CMOS stack and surrounded by low-k dielectric. Experimental results from the first generation hybrid CMOS-MEMS show RBTs operating at 11.1-11.5 GHz with footprints <; 5μm × 3μm. The response of active resonators is shown to contrast with passive resonators showing no discernible peak. Comparative behavior of devices with design variations is used to demonstrate the effect of ABRs on spurious mode suppression. Temperature stability and TCF compensation due to complimentary materials in the CMOS stack are experimentally verified.
Keywords :
CMOS integrated circuits; MOSFET; compensation; field effect MMIC; low-k dielectric thin films; microfabrication; micromechanical resonators; piezoresistive devices; silicon-on-insulator; ABR; CMOS stack; IBM SOI CMOS technology; RBT; TCF compensation; acoustic Bragg reflectors; acoustic vibrations; active resonator response; first generation hybrid CMOS-MEMS; frequency 11.1 GHz to 11.5 GHz; low-k dielectric; n-channel field effect transistor; nFET; passive resonators; resonant body transistors; size 32 nm; spurious mode suppression; temperature stability; transistor level; unreleased CMOS-integrated MEMS resonators; CMOS integrated circuits; Resonant frequency; Sensors; Silicon; Temperature measurement; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SOI Conference (SOI), 2012 IEEE International
Conference_Location :
NAPA, CA
ISSN :
1078-621X
Print_ISBN :
978-1-4673-2690-2
Electronic_ISBN :
1078-621X
Type :
conf
DOI :
10.1109/SOI.2012.6404400
Filename :
6404400
Link To Document :
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