• DocumentCode
    2853296
  • Title

    Characterization of a Multilevel HV-IGBT Module for Distribution Applications

  • Author

    Lai, Jih-Sheng ; Hefner, Allen ; Maitra, Arindam ; Goodman, Frank

  • Author_Institution
    Dept. of ECE, Virginia Polytech. Inst. & State Univ., Blacksburs, VA
  • Volume
    2
  • fYear
    2006
  • fDate
    8-12 Oct. 2006
  • Firstpage
    747
  • Lastpage
    753
  • Abstract
    A newly proposed 3-level high-voltage insulated-gate-bipolar-transistor (HV-IGBT) module has been developed and tested under static conduction, dynamic switching, and system level pulse-width-modulation (PWM) operation. The conduction voltage drops and switching turn-on and -off energies were measured for loss estimation. Switching voltage and current waveforms were used for parasitic inductance and output capacitance estimation. With sufficiently low parasitic inductance and fast switching speed, the module was successfully operating at 20-kHz switching for a multilevel converter based intelligent universal transformer (IUT), and the proposed multilevel HV-IGBT module is evidently the enabling technology for future utility distribution-level power electronics applications
  • Keywords
    PWM power convertors; high-voltage engineering; insulated gate bipolar transistors; power bipolar transistors; power distribution; power transformers; 20 kHz; conduction voltage; dynamic switching; insulated gate bipolar transistor; intelligent universal transformer; multilevel converter; output capacitance estimation; parasitic inductance estimation; pulse-width-modulation; static conduction; Energy measurement; Inductance; Insulation; Loss measurement; Parasitic capacitance; Pulse width modulation; Space vector pulse width modulation; Switching converters; System testing; Voltage; HV-IGBT; Intelligent Universal Transformer; Multilevel HV-IGBT Module;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Conference, 2006. 41st IAS Annual Meeting. Conference Record of the 2006 IEEE
  • Conference_Location
    Tampa, FL
  • ISSN
    0197-2618
  • Print_ISBN
    1-4244-0364-2
  • Electronic_ISBN
    0197-2618
  • Type

    conf

  • DOI
    10.1109/IAS.2006.256610
  • Filename
    4025296