Title :
Measurement ratio testing for improved quality and outlier detection
Author :
Roehr, Jeffrey L.
Author_Institution :
Analog Devices, Wilmington, MA
Abstract :
Measurement Ratio tests of analog test values are used to improve product quality using existing ATE test data. The use of measurement ratio tests is shown to have no impact on overall lot test time, while improving product quality through the detection of fabrication and test outliers. The definition of a data driven method to select test pairs for Measurement Ratio testing based on production test data improves fabrication outlier elimination in production.
Keywords :
production testing; statistical analysis; ATE test data; analog test values; fabrication outlier elimination; measurement ratio testing; product quality; production test data; test outlier detection; Costs; Electronic equipment testing; Fabrication; Materials testing; Packaging; Particle measurements; Performance evaluation; Production; Radio frequency; Time measurement;
Conference_Titel :
Test Conference, 2007. ITC 2007. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-1127-6
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2007.4437616
