Title :
Finding power/ground defects on connectors — a new approach
Author :
Parker, Kenneth P. ; Hird, Stephen
Author_Institution :
Agilent Technol., Loveland, CO
Abstract :
Printed circuit boards are steadily becoming faster, and as a result, relatively ordinary defects in connectors and sockets can now have more subtle and damaging effects. At the same time these defects defy detection by conventional technologies. This paper surveys existing tests for these defects and introduces a new solution based on network parameter measurements.
Keywords :
electric connectors; inspection; printed circuit testing; connector defects; ground defects; network parameter measurements; power defects; printed circuit boards; socket defects; Clocks; Connectors; Degradation; Electromagnetic interference; Electronic equipment testing; Keyways; Pins; Printed circuits; Signal design; Sockets;
Conference_Titel :
Test Conference, 2007. ITC 2007. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-1127-6
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2007.4437624
