Title :
IEEE P1581 can solve your board level memory cluster test problems
Author :
Ehrenberg, Heiko
Author_Institution :
GOEPEL Electron., Austin, TX
Abstract :
This paper highlights various challenges test engineers face when they attempt to test pin connectivity on memory devices at board and system level. IEEE P1581 was presented as an elegant solution to these challenges. Furthermore, this paper provide an update on the latest developments in the IEEE PI581 specification.
Keywords :
integrated circuit testing; integrated memory circuits; IEEE PI581 specification; board level memory cluster test problems; pin connectivity testing; system level; Circuit testing; Design for testability; EPROM; Electronic equipment testing; Life testing; Manufacturing; Pins; Random access memory; Read-write memory; System testing;
Conference_Titel :
Test Conference, 2007. ITC 2007. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-1127-6
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2007.4437625
