• DocumentCode
    2853420
  • Title

    IEEE P1581 can solve your board level memory cluster test problems

  • Author

    Ehrenberg, Heiko

  • Author_Institution
    GOEPEL Electron., Austin, TX
  • fYear
    2007
  • fDate
    21-26 Oct. 2007
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    This paper highlights various challenges test engineers face when they attempt to test pin connectivity on memory devices at board and system level. IEEE P1581 was presented as an elegant solution to these challenges. Furthermore, this paper provide an update on the latest developments in the IEEE PI581 specification.
  • Keywords
    integrated circuit testing; integrated memory circuits; IEEE PI581 specification; board level memory cluster test problems; pin connectivity testing; system level; Circuit testing; Design for testability; EPROM; Electronic equipment testing; Life testing; Manufacturing; Pins; Random access memory; Read-write memory; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2007. ITC 2007. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-1127-6
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2007.4437625
  • Filename
    4437625
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2853420